DIN EN 62047-12:2012-06
Current
Current
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 12: BENDING FATIGUE TESTING METHOD OF THIN FILM MATERIALS USING RESONANT VIBRATION OF MEMS STRUCTURES (IEC 62047-12:2011)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2012
US$151.14
Excluding Tax where applicable
| DevelopmentNote |
Supersedes DIN IEC 62047-12. (06/2012)
|
| DocumentType |
Standard
|
| Pages |
31
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 62047-12:2011 | Identical |
| IEC 62047-12:2011 | Identical |
Summarise
US$151.14
Excluding Tax where applicable
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