DIN EN 62047-6:2010-07
Current
Current
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 6: AXIAL FATIGUE TESTING METHODS OF THIN FILM MATERIALS
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
07-01-2010
US$124.43
Excluding Tax where applicable
| DevelopmentNote |
Supersedes DIN IEC 62047-6. (07/2010)
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 62047-6:2010 | Identical |
| IEC 62047-6:2009 | Identical |
| BS EN 62047-6:2010 | Equivalent |
| I.S. EN 62047-6:2010 | Equivalent |
| UNE-EN 62047-6:2010 | Equivalent |
Summarise
US$124.43
Excluding Tax where applicable
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