DIN EN IEC 60749-37:2023-02 (Draft)
Superseded
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020
Available format(s)
Hardcopy , PDF
Language(s)
German - English
Published date
02-01-2023
Superseded date
12-02-2023
Superseded by
US$144.27
Excluding Tax where applicable
| DocumentType |
Draft
|
| Pages |
42
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Superseded
|
| SupersededBy |
Summarise
US$144.27
Excluding Tax where applicable
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