DIN EN IEC 60749-37:2023-12
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
12-01-2023
US$174.79
Excluding Tax where applicable
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
Summarise
US$174.79
Excluding Tax where applicable
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