DSCC 18209B:2021
Superseded
Superseded
View Superseded by
MICROCIRCUIT, DIGITAL-LINEAR, 12 BIT, RF SAMPLING, ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON
Published date
02-09-2021
Publisher
Superseded date
05-20-2025
Superseded by
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
| JEDEC JESD 204:2017 | SERIAL INTERFACE FOR DATA CONVERTERS |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| JEDEC JEP 157 : 2009 | RECOMMENDED ESD-CDM TARGET LEVELS |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
Sorry this product is not available in your region.