EN 61000-4-23:2000
Withdrawn
Electromagnetic compatibility (EMC) - Part 4-23: Testing and measurement techniques - Test methods for protective devices for HEMP and other radiated disturbances
12-21-2000
11-01-2003
INTRODUCTION
Clause
1 Scope
2 Normative references
3 Definitions
4 HEMP test concepts
4.1 Testing of shielding enclosures
4.2 Testing of shielded cables and connectors
4.3 Testing of shielding materials
4.4 Test concept summary
5 HEMP test procedures
5.1 Electromagnetic field testing
5.2 Current injection test procedures
Annex A (informative) HEMP test concepts for electrical
systems
Annex B (informative) Characterization of shielded
cables
Annex C (informative) Equipment for HEMP pulse
measurements
Annex D (informative) Equipment for CW testing
Annex E (informative) Characterization of planar shield
for HEMP protection
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Provides the basic reasons behind HEMP testing and gives a brief description of the most important concepts for shielding element testing. For each test, the following basic information is provided: - theoretical foundation of the test (the test concept); - test set-up; - required equipment; - test procedures; - data processing.
| Committee |
CLC/TC 210
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| VDE 0847-4-23 : 2001 | Identical |
| NF EN 61000-4-23 : 2001 | Identical |
| NEN EN IEC 61000-4-23 : 2001 | Identical |
| I.S. EN 61000-4-23:2000 | Identical |
| IEC 61000-4-23:2016 | Identical |
| BS EN 61000-4-23:2001 | Identical |
| NBN EN 61000 4-23 : 2001 | Identical |
| CEI EN 61000-4-23 : 2002 | Identical |
| PN EN 61000-4-23 : 2002 | Identical |
| DIN EN 61000-4-23 : 2001 | Identical |
| BS EN 61337-1:2004 | Identical |
| UNE-EN 61000-4-23:2002 | Identical |
| EN 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| BS EN 61000-4-20:2003 | Electromagnetic Compatibility (EMC) Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| CEI EN 61000-4-20 : 2013 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
| BS EN 61000-5-7:2001 | Electromagnetic compatibility (EMC). Installation and mitigation guidelines Installation and mitigation guidelines. Degrees of protection by enclosures against electromagnetic disturbances (EM code) - Degrees of protection against electromagnetic disturbances provided by enclosures (EM code) |
| BS EN 61000-4-1:2007 | Electromagnetic compatibility (EMC) Testing and measurement techniques. Overview of IEC 61000-4 series |
| CEI EN 61000-5-7 : 2003 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 5-7: INSTALLATION AND MITIGATION GUIDELINES - DEGREES OF PROTECTION BY ENCLOSURES AGAINST ELECTROMAGNETIC DISTURBANCES (EM CODE) |
| I.S. EN 61000-4-1:2007 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-1: TESTING AND MEASUREMENT TECHNIQUES - OVERVIEW OF IEC 61000-4 SERIES |
| I.S. EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
| EN 61000-4-1:2007 | Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series |
| IEC 60625-2:1993 | Programmable measuring instruments - Interface system (byte serial, bit parallel) - Part 2: Codes, formats, protocols and common commands |
| IEEE 488 : 1978 | STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION (INCLUDES SUPPLEMENT) |
| IEC 61000-2-9:1996 | Electromagnetic compatibility (EMC) - Part 2: Environment - Section 9: Description of HEMP environment - Radiated disturbance. Basic EMC publication |
| IEC 60625-1:1993 | Programmable measuring instruments - Interface system (byte serial, bit parallel) - Part 1: Functional, electrical and mechanical specifications, system applications and requirements for the designer and user |