IEC 60060-3:1976
Superseded
High-voltage test techniques - Part 3: Measuring devices
Hardcopy , PDF
English, English - French, Russian
01-01-1976
09-12-2022
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Common tests and checks on a measuring system
4.1 Acceptance test
4.2 Performance test
4.3 Performance check
4.4 Record of performance
5 Tests with direct voltage
5.1 General
5.2 Definitions for direct voltage tests
5.3 Test voltage
5.4 Measurement of the test voltage
5.5 Tests and checks on measuring systems
5.6 Withstand voltage test procedure
6 Tests with alternating voltage
6.1 General
6.2 Definitions for alternating voltage tests
6.3 Test voltage
6.4 Measurement of the test voltage
6.5 Tests and checks on measuring systems
6.6 Withstand voltage test procedure
7 Tests with lightning impulse voltage
7.1 General
7.2 Definitions for lightning impulse voltage tests
7.3 Test voltage
7.4 Measurement of the test voltage and determination
of the impulse voltage shape
7.5 Tests and checks on measuring systems
7.6 Withstand voltage test procedures
8 Tests with switching impulse voltage
8.1 General
8.2 Definitions for switching impulse voltage tests
8.3 Test voltage
8.4 Measurement of the test voltage and determination
of the impulse shape
8.5 Tests and checks on measuring systems
8.6 Withstand voltage test procedures
9 Tests with very low frequency voltages
9.1 General
9.2 Definitions for very low frequency voltage tests
9.3 Test voltage
9.4 Measurement of the test voltage
9.5 Tests and checks on measuring systems
9.6 Test procedure
10 Tests with damped alternating voltages
10.1 General
10.2 Definitions for damped alternating voltage tests
10.3 Test voltage
10.4 Measurement of the test voltage
10.5 Tests and checks on measuring systems
10.6 Test procedure
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
| Committee |
TC 42
|
| DevelopmentNote |
Supersedes IEC 60060 (07/2004) Stability Date: 2017. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| Standards | Relationship |
| NF EN 60060-3 : 2006 | Identical |
| NEN EN IEC 60060-3 : 2006 C11 2006 | Identical |
| I.S. EN 60060-3:2006 | Identical |
| PN EN 60060-3 : 2008 | Identical |
| AS 60060.3-2008 | Identical |
| VDE 0432-3:2006-08 | Identical |
| BIS IS/IEC 60060-3 : 2006 | Identical |
| BS EN 60060-3:2006 | Identical |
| CEI EN 60060-3 : 2006 | Identical |
| EN 60060-3:2006/corrigendum Oct. 2006 | Identical |
| UNE-EN 60060-3:2006 | Identical |
| CEI 42-5 : 1ED 1981 | Identical |
| BS 923-3:1980 | Identical |
| NEN 10060-3 : 1980 | Identical |
| NFC 41 103 : 1977 | Identical |
| UNE 21308-3:1977 | Identical |
| BS EN 60601-2-46:2011 | Identical |
| BS EN 60068-3-1:1999 | Identical |