IEC 60340:1974
Withdrawn
Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation
Hardcopy , PDF
English - French
01-01-1974
12-31-2021
To be used for checking conformity of actual characteristic parameters with ratings or specifications. For test procedures applicable to semiconductor detectors, see Publications 333 and 430.
| Committee |
TC 45
|
| DocumentType |
Standard
|
| Pages |
73
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| HD 404 : 200S1 | Identical |
| BIS IS 11645 : 1985(R2001) | Identical |
| CEI 45-11 : 1997 | Identical |
| IEC 60333:1993 | Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures |
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