IEC 60483:1976
Current
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
Hardcopy , PDF
English - French, Russian
01-01-1976
Reviews admittance characteristics and equivalent circuits of ceramic resonators vibrating in simple modes. Contains methods for determining resonator parameters and material constants.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
35
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| DIN IEC 60483:1988-04 | Identical |
| BS EN 50324-1:2002 | Piezoelectric properties of ceramic materials and components Terms and definitions |
| IEC 62047-30:2017 | Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
| EN 50324-1:2002 | Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions |
| 16/30338636 DC : 0 | BS IEC 62047-30 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 30: MEASUREMENT METHODS OF ELECTRO-MECHANICAL CONVERSION CHARACTERISTICS OF MEMS PIEZOELECTRIC THIN FILM |
| 17/30309777 DC : 0 | BS ISO 19622 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR PIEZOELECTRIC CONSTANT D[33] OF PIEZOELECTRIC CERAMICS BY DIRECT QUASI-STATIC METHOD |
| BS IEC 62047-30:2017 | Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
| NF EN 50324-1 : 2002 | PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
| ISO 19622:2018 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for piezoelectric constant d33 of piezoelectric ceramics by direct quasi-static method |
| ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Measurement method of piezoelectric strain at high electric field |
| BS ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field |
| 14/30265605 DC : 0 | BS ISO 17859 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - MEASUREMENT METHOD OF PIEZOELECTRIC STRAIN AT HIGH ELECTRIC FIELD |
| I.S. EN 50324-1:2002 | PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
| NF EN 60917-1 : 99 AMD 1 2001 | MODULAR ORDER FOR THE DEVELOPMENT OF MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT PRACTICES - PART 1: GENERIC STANDARD |
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