IEC 60747-12-3:1998
Withdrawn
Semiconductor devices - Part 12-3: Optoelectronic devices - Blank detail specification for light-emitting diodes- Display application
Hardcopy , PDF
English
02-26-1998
02-15-2005
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
Annex A (normative) Electrical endurance
A.1 Test circuit
A.2 Operating conditions
Defines the quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing.
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| BS IEC 60747-12.3 : 1998 | Identical |
| SAC GB/T 18904.3 : 2002 | Identical |
| NEN IEC 60747-12-3 : 1998 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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