IEC 60747-7-2:1989
Withdrawn
Semiconductor devices - Discrete devices - Part 7: Bipolartransistors - Section Two: Blank detail specification forcase-rated bipolar transistors for low-frequency amplification
Hardcopy , PDF
English - French, Russian
03-31-1989
12-15-2006
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
This standard is a blank detail specification for case rated bipolar transistors for low frequency amplification.
| Committee |
TC 47/SC 47E
|
| DevelopmentNote |
Also numbered as BS QC 750103(1990) (08/2005)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| DIN IEC 60747-7-2:1992-05 | Identical |
| PN 92/T-01210.01 : 1992 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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