IEC 60747-8-3:1995
Superseded
View Superseded by
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications
Hardcopy , PDF
English - French
04-20-1995
01-13-2014
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
This publication also bears the number QC 750114 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).
| DevelopmentNote |
Also numbered as BS QC750114(1996) (08/2005) Stability Date: 2013. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
37
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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