IEC 60749-1:2002
Current
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Hardcopy , PDF
08-30-2002
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.The contents of the corrigendum of August 2003 have been included in this copy.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS EN 60749-1:2003 | Identical |
| CEI EN 60749-1 : 2005 | Identical |
| EN 60749-1:2003 | Identical |
| DIN EN 60749-1:2003-12 | Identical |
| NF EN 60749-1 : 2003 | Identical |
| NEN EN IEC 60749-1 : 2003 | Identical |
| I.S. EN 60749-1:2003 | Identical |
| PN EN 60749-1 : 2005 | Identical |
| UNE-EN 60749-1:2004 | Identical |
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