NEN EN IEC 60749-1 : 2003
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
Published date
01-12-2013
Publisher
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Summarise this standard
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Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
| DevelopmentNote |
Supersedes NEN EN IEC 60749. (09/2011)
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| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
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| Status |
Current
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| Supersedes |
| Standards | Relationship |
| IEC 60749-1:2002 | Identical |
| EN 60749-1:2003 | Identical |
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