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IEC 60749-10:2002/COR1:2003

Superseded

Superseded

View Superseded by

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Amendment of

IEC 60749-10:2002

Available format(s)

Hardcopy , PDF

Language(s)

English - French

Published date

08-13-2003

Superseded date

04-27-2022

Superseded by

IEC 60749-10:2022

Free

Modification of the validity date: now put at 2007.

Committee
TC 47
DocumentType
Corrigendum
Pages
0
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Free