IEC 60749-10:2002
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Hardcopy , PDF
04-09-2002
04-27-2022
FOREWORD
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.The contents of the corrigendum of August 2003 have been included in this copy.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62186 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2019. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NF EN 60749-10 : 2002 | Identical |
| NEN EN IEC 60749-10 : 2002 | Identical |
| I.S. EN 60749-10:2002 | Identical |
| PN EN 60749-10 : 2004 | Identical |
| BS EN 60749-10:2002 | Identical |
| CEI EN 60749-10 : 2004 | Identical |
| EN 60749-10:2002 | Identical |
| UNE-EN 60749-10:2003 | Identical |
| I.S. EN 60749-10:2002 | Equivalent |
| DIN EN 60749-10:2003-04 | Identical |
A newer version of this standard is available.
View Current Edition
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.