NF EN 60749-10 : 2002
Superseded
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK
Published date
01-12-2013
Publisher
Superseded date
01-14-2023
Superseded by
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
| DevelopmentNote |
Indice de classement: C96-022-10. (03/2003) Supersedes NF EN 60749. (06/2007)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Superseded
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| SupersededBy |
| Standards | Relationship |
| DIN EN 60749-10:2003-04 | Identical |
| BS EN 60749-10:2002 | Identical |
| EN 60749-10:2002 | Identical |
| NBN EN 60749-10 : 2003 | Identical |
| IEC 60749-10:2002 | Identical |
| I.S. EN 60749-10:2002 | Identical |
| UNE-EN 60749-10:2003 | Identical |
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