BS EN 60749-10:2002
Withdrawn
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Mechanical shock
Hardcopy , PDF
English
09-17-2002
01-18-2023
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203568 DC (09/2002) Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| NF EN 60749-10 : 2002 | Identical |
| EN 60749-10:2002 | Identical |
| NBN EN 60749-10 : 2003 | Identical |
| IEC 60749-10:2002 | Identical |
| I.S. EN 60749-10:2002 | Identical |
| DIN EN 60749-10:2003-04 | Identical |
| UNE-EN 60749-10:2003 | Identical |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
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