DIN EN 60749-10:2003-04
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002
Hardcopy , PDF
German
04-01-2003
12-01-2023
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
| DevelopmentNote |
Supersedes DIN EN 60749 (06/2005)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| BS EN 60749-10:2002 | Identical |
| NF EN 60749-10 : 2002 | Identical |
| EN 60749-10:2002 | Identical |
| NBN EN 60749-10 : 2003 | Identical |
| IEC 60749-10:2002 | Identical |
| I.S. EN 60749-10:2002 | Identical |
| UNE-EN 60749-10:2003 | Identical |
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