EN 60749-10:2002
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
08-14-2002
07-01-2005
FOREWORD
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.
| Committee |
CLC/TC 47X
|
| DevelopmentNote |
Supersedes EN 60749. (NELMS 06/2017)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| SS-EN IEC 60749-10, UTG 2:2022 | Identical |
| NF EN 60749-10 : 2002 | Identical |
| IEC 60749-10:2002 | Identical |
| NBN EN 60749-10 : 2003 | Identical |
| NEN EN IEC 60749-10 : 2002 | Identical |
| I.S. EN 60749-10:2002 | Identical |
| PN EN 60749-10 : 2004 | Identical |
| BS EN 60749-10:2002 | Identical |
| CEI EN 60749-10 : 2004 | Identical |
| DIN EN 60749-10:2003-04 | Identical |
| UNE-EN 60749-10:2003 | Identical |