IEC 60749-23:2004
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Hardcopy , PDF
02-23-2004
12-09-2025
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-EN 60749-23:2005 | Identical |
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