UNE-EN 60749-23:2005
Current
Current
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Available format(s)
Hardcopy , PDF
Published date
03-16-2005
Publisher
US$66.07
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-23:2011-07 | Identical |
| IEC 60749-23:2004+AMD1:2011 CSV | Identical |
| NBN EN 60749-23 : 2005 AMD 1 2011 | Identical |
| I.S. EN 60749-23:2004 | Identical |
| NF EN 60749-23 : 2004 AMD 1 2012 | Identical |
| EN 60749-23:2004 | Identical |
| IEC 60749-23:2004 | Identical |
| EN 60749-23:2004/A1:2011 | Identical |
| BS EN 60749-23 : 2004 | Identical |
Summarise
US$66.07
Excluding Tax where applicable
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