IEC 60749-29:2003
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Hardcopy , PDF
English - French, Spanish, Castilian
11-04-2003
09-12-2022
Covers the I-test and the overvoltage latch-up testing of integrated circuits.The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
41
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UNE-EN 60749-29:2004 | Identical |
| BS EN 60749-29:2003 | Identical |
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