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IEC 60749-30:2005/AMD1:2011

Superseded

Superseded

View Superseded by

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Amendment of

IEC 60749-30:2005

Available format(s)

Hardcopy , PDF

Language(s)

English, English - French

Published date

05-25-2011

Superseded date

09-12-2022

US$29.00
Excluding Tax where applicable
Summarise this standard

Committee
TC 47
DocumentType
Amendment
Pages
14
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
BS EN 60749-30:2005+A1:2011 Identical

⚠

A newer version of this standard is available.

View Current Edition View Current Edition
US$29.00
Excluding Tax where applicable