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BS EN 60749-30:2005+A1:2011

Superseded

Superseded

View Superseded by

Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

09-30-2011

Superseded date

09-30-2020

Superseded by

BS EN IEC 60749-30:2020

US$238.62
Excluding Tax where applicable
Summarise this standard

Committee
EPL/47
DocumentType
Standard
Pages
0
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
EN 60749-30:2005/A1:2011 Identical
IEC 60749-30:2005/AMD1:2011 Identical
IEC 60749-30:2005 Identical

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A newer version of this standard is available.

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US$238.62
Excluding Tax where applicable