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EN 60749-30:2005/A1:2011

Withdrawn

Withdrawn

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Amendment of

EN 60749-30:2005

Published date

07-08-2011

Withdrawn date

06-29-2014

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Committee
CLC/SR 47
DocumentType
Amendment
PublisherName
European Committee for Standards - Electrical
Status
Withdrawn

Standards Relationship
BS EN 60749-30:2005+A1:2011 Identical

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