EN 60749-30:2005
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Amended by
Published date
03-01-2005
Withdrawn date
02-01-2008
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Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing in order to evaluate long term reliability.
| Committee |
CLC/SR 47
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| BS EN 60749-30 : 2005 | Equivalent |
| I.S. EN 60749-30:2005 | Equivalent |
| BS EN 61158-6-7:2008 | Identical |
| UNE-EN 60749-30:2005 | Identical |
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