I.S. EN 60749-30:2005
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
Hardcopy , PDF
English
01-01-2005
10-29-2020
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
1 Scope
2 Normative references
3 General description
4 Test apparatus and materials
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
41
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60749-30:2005+AMD1:2011 CSV | Identical |
| BS EN 60749-30 : 2005 | Identical |
| NF EN 60749-30 : 2005 AMD 1 2011 | Identical |
| DIN EN 60749-30:2011-12 | Identical |
| EN 60749-30 : 2005 AMD 1 2011 | Identical |
| NBN EN 60749-30 : 2006 AMD 1 2011 | Identical |
| IEC 60749-30:2005 | Equivalent |
| EN 60749-30:2005 | Equivalent |
| UNE-EN 60749-30:2005 | Identical |
A newer version of this standard is available.
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