EN 60749-30 : 2005 AMD 1 2011
Superseded
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
Published date
01-12-2013
Superseded date
10-01-2020
Superseded by
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FOREWORD
1 Scope
2 Normative references
3 General description
4 Test apparatus and materials
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
| Committee |
SR 47
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 60749-30 : 2005 AMD 1 2011 | Identical |
| IEC 60749-30:2005+AMD1:2011 CSV | Identical |
| NBN EN 60749-30 : 2006 AMD 1 2011 | Identical |
| NEN EN IEC 60749-30 : 2005 AMD 1 2011 | Identical |
| I.S. EN 60749-30:2005 | Identical |
| PN EN 60749-30 : 2007 AMD 1 2011 | Identical |
| BS EN 60749-30 : 2005 | Identical |
| DIN EN 60749-30:2011-12 | Identical |
| CEI EN 60749-30/A1:2012 | Identical |
| UNE-EN 60749-30:2005 | Identical |
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