IEC 60749-31:2002
Current
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Hardcopy , PDF
08-30-2002
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test Procedure
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.The contents of the corrigendum of August 2003 have been included in this copy.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-31 : 2003 | Identical |
| NEN EN IEC 60749-31 : 2003 | Identical |
| I.S. EN 60749-31:2003 | Identical |
| PN EN 60749-31 : 2005 | Identical |
| BS EN 60749-31:2003 | Identical |
| CEI EN 60749-31 : 2004 | Identical |
| EN 60749-31:2003 | Identical |
| DIN EN 60749-31:2003-12 | Identical |
| UNE-EN 60749-31:2004 | Identical |
| 13/30264591 DC : 0 | BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
| 13/30264600 DC : 0 | BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
| 13/30264596 DC : 0 | BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
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