NEN EN IEC 60749-31 : 2003
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
Published date
01-12-2013
Publisher
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Summarise this standard
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Applies to semiconductor devices (discrete devices and integrated circuits). It's test objective is to determine the device ignites due to internal heating caused by excessive overloads.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-31:2002 | Identical |
| EN 60749-31:2003 | Identical |
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