IEC PAS 61338-1-5:2010
Superseded
View Superseded by
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Hardcopy , PDF
English
05-19-2010
06-25-2015
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and sigma[i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of equation (4)
for R[i]
Annex B (informative) - Calculation uncertainty of
parameters in Figure 3
Bibliography
IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.
| DevelopmentNote |
Stability Date: 2015. (10/2012)
|
| DocumentType |
Miscellaneous Product
|
| Pages |
20
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 61338-1-5 : 2010 | Identical |
| DD IEC PAS 61338-1-5 : DRAFT JULY 2010 | Identical |
| IEC 61338-1-4:2005 | Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency |
| IEC 61338-1-3:1999 | Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.