NEN NPR IEC/PAS 61338-1-5 : 2010
Superseded
Superseded
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WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
Published date
01-12-2013
Publisher
Superseded date
09-24-2015
Superseded by
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Provides a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate designated as R[i] and sigma[i] respectively, and are called interface resistance and interface conductivity.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC PAS 61338-1-5:2010 | Identical |
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