IEC PAS 62191:2000
Superseded
View Superseded by
Acoustic microscopy for nonhermetic encapsulated electronic components
Hardcopy , PDF
English
11-28-2000
10-17-2001
FOREWORD
1 Scope
2 Definitions
3 Apparatus
4 Procedure
Annex A - Acoustic Microscopy Check Sheet
Annex B - Potential Image Pitfalls
Annex C - Some Limitations of Acoustic Microscopy
Annex D - Reference Procedure for Presenting Applicable
Scanned Data
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.
| DocumentType |
Miscellaneous Product
|
| Pages |
16
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62191 : 2001 | Identical |
| IPC J STD 035 : 0 | Identical |
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