IEEE 1450-1999
Superseded
Superseded
View Superseded by
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Available format(s)
PDF
Language(s)
English
Published date
09-01-1999
Superseded date
04-24-2024
Superseded by
US$438.37
Excluding Tax where applicable
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| Pages |
140
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| IEEE 1450.6-2005 | IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL) |
| IEEE P1450.4 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification |
| IEEE 1450.6.2-2014 | IEEE Standard for Memory Modeling in Core Test Language |
| IEEE 1450.3-2007 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification |
| IEEE 1450.6.1-2009 | IEEE Standard for Describing On-Chip Scan Compression |
| IEEE 260.1-1993 | American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) |
Summarise
US$438.37
Excluding Tax where applicable
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