IEEE 1450.6.1-2009
Withdrawn
Withdrawn
IEEE Standard for Describing On-Chip Scan Compression
Available format(s)
PDF
Language(s)
English
Published date
07-13-2009
Withdrawn date
03-05-2020
US$160.38
Excluding Tax where applicable
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| IEEE 1450.2-2002 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification |
| IEEE 1450.1-2005 | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments |
| IEEE 1450-1999 | IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data |
| IEEE 1450.6-2005 | IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL) |
Summarise
US$160.38
Excluding Tax where applicable
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