IEEE 1671.2-2012
Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
PDF , Hardcopy
English
02-15-2013
03-30-2023
1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 InstrumentDescription schema
5 InstrumentDescription instance schema
6 ATML InstrumentDescription XML schema names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download Web site material
associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Also numbered as IEC 61671-2. (04/2016)
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-8144-8
|
| Pages |
52
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEEE 1155 : 1992 | VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS |
| TIA 232 : F1997(R2012) | INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE |
| IEC 60488-2:2004 | Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands |
| IEEE 802.3-2012 | IEEE Standard for Ethernet |
| IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| MIL-PRF-55310 Revision E:2006 | Oscillator, Crystal Controlled, General Specification for |
| MIL-STD-1309 Revision D:1992 | Definitions of Terms for Testing, Measurement and Diagnostics |
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