IEEE 1671.2-2008
Superseded
Superseded
View Superseded by
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
Available format(s)
PDF
Language(s)
English
Published date
12-17-2008
Superseded date
10-15-2021
Superseded by
US$152.06
Excluding Tax where applicable
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
228
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| IEEE 1671-2006 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
Summarise
US$152.06
Excluding Tax where applicable
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