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IEEE 1671-2006

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Available format(s)

PDF

Superseded date

10-19-2021

Language(s)

English

Published date

12-15-2006

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DocumentType
Standard
Pages
89
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy

IEEE 1636.2-2010 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)
IEEE 1636.1-2007 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEEE 1671.5-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE 1671.4-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE 1671.6-2008 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE 1671.2-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

IEEE 1232-2002 IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)
IEEE 1522-2004 IEEE Standard for Testability and Diagnosability Characteristics and Metrics
IEEE 1641-2004 IEEE Standard for Signal and Test Definition

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