IEEE 1671-2006
Superseded
Superseded
View Superseded by
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Available format(s)
PDF
Language(s)
English
Published date
12-15-2006
Superseded date
10-19-2021
Superseded by
US$130.68
Excluding Tax where applicable
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
89
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| IEEE 1636.2-2010 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) |
| IEEE 1636.1-2007 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML) |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEEE 1671.5-2008 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information |
| IEEE 1671.4-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information |
| IEEE 1671.6-2008 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information |
| IEEE 1671.2-2008 | IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions |
| IEEE 1671.3-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
| IEEE 1232-2002 | IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) |
| IEEE 1522-2004 | IEEE Standard for Testability and Diagnosability Characteristics and Metrics |
| IEEE 1641-2004 | IEEE Standard for Signal and Test Definition |
Summarise
US$130.68
Excluding Tax where applicable
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