IEEE 1671.6-2008
Superseded
Superseded
View Superseded by
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
Available format(s)
PDF
Language(s)
English
Published date
02-01-2013
Superseded date
04-17-2016
Superseded by
US$83.16
Excluding Tax where applicable
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| IEEE 1671-2006 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
Summarise
US$83.16
Excluding Tax where applicable
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