IEEE 1671.5-2008
Superseded
Superseded
View Superseded by
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
Available format(s)
PDF
Language(s)
English
Published date
02-01-2012
Superseded date
10-15-2021
Superseded by
US$83.16
Excluding Tax where applicable
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| IEEE 1671-2006 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
Summarise
US$83.16
Excluding Tax where applicable
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.