IEEE 325-1986
Superseded
Superseded
View Superseded by
IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors
Available format(s)
PDF
Language(s)
English
Published date
03-30-1987
Superseded date
07-23-2013
Superseded by
US$74.84
Excluding Tax where applicable
| Committee |
Nuclear Instruments and Detectors
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| IEEE 300-1988 | IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors |
| IEEE 1160-1993 | IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors |
| IEEE 759-1984 | IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
Summarise
US$74.84
Excluding Tax where applicable
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