IEEE 759-1984
Withdrawn
Withdrawn
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Available format(s)
PDF
Language(s)
English
Published date
12-15-1984
Withdrawn date
01-18-2007
US$167.51
Excluding Tax where applicable
| Committee |
Nuclear Instruments and Detectors
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| IEEE 325-1986 | IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors |
| IEEE 1160-1993 | IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors |
| IEEE 301-1976 | IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation |
| IEEE 300-1988 | IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors |
Summarise
US$167.51
Excluding Tax where applicable
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