ISO 14880-4:2006
Withdrawn
Withdrawn
View Superseded by
Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties
Published date
05-19-2006
Withdrawn date
04-09-2025
Superseded by
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ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.
| Committee |
ISO/TC 172/SC 9
|
| DevelopmentNote |
Supersedes ISO/DIS 14880-4 (05/2006)
|
| DocumentType |
Standard
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| DIN EN ISO 14880-4:2006-08 | Identical |
| NF EN ISO 14880-4 : 2006 | Identical |
| NBN EN ISO 14880-4 : 2006 | Identical |
| NEN EN ISO 14880-4 : 2006 | Identical |
| NS EN ISO 14880-4 : 1ED 2006 | Identical |
| I.S. EN ISO 14880-4:2006 | Identical |
| PN EN ISO 14880-4 : 2006 | Identical |
| BS EN ISO 14880-4:2006 | Identical |
| EN ISO 14880-4:2006 | Identical |
| UNE-EN ISO 14880-4:2007 | Identical |
| ISO/TR 14880-5:2010 | Optics and photonics — Microlens arrays — Part 5: Guidance on testing |
| VDI 5581:2011-11 | Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics |
| PD ISO/TR 14880-5:2010 | Optics and photonics. Microlens arrays Guidance on testing |
| ISO 14880-2:2006 | Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 14880-1:2016 | Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties |
| ISO/TR 14999-1:2005 | Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 1: Terms, definitions and fundamental relationships |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
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