ISO 18115-2:2013
Withdrawn
Withdrawn
View Superseded by
Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
11-04-2013
Withdrawn date
04-09-2025
Superseded by
US$96.00
Excluding Tax where applicable
ISO 18115-2:2013 defines terms for surface chemical analysis.
| Committee |
ISO/TC 201/SC 1
|
| DevelopmentNote |
Together with ISO 18115-1, supersedes ISO 18115. (07/2010) Supersedes ISO/DIS 18115-2. (11/2013)
|
| DocumentType |
Standard
|
| Pages |
45
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| JIS K 0147-2:2017 | Identical |
| BS ISO 18115-2:2013 | Identical |
| NF ISO 18115-2 : 2010 | Identical |
| NEN ISO 18115-2 : 2010 | Identical |
| 11/30199166 DC : 0 | BS ISO 11952 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - DETERMINATION OF GEOMETRIC QUANTITIES USING SPM - CALIBRATION OF MEASURING SYSTEMS |
| ISO 11775:2015 | Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants |
| BS PD ISO/TS 80004-6 : 2013 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION |
| CEN ISO/TS 80004-6:2015 | Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS 80004-6:2013) |
| BS ISO 28600:2011 | Surface chemical analysis. Data transfer format for scanning-probe microscopy |
| ASTM E 2859 : 2011 | Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
| S.R. CEN ISO/TS 80004-6:2015 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013) |
| BS ISO 23833:2013 | Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary |
| ISO/TS 80004-13:2017 | Nanotechnologies — Vocabulary — Part 13: Graphene and related two-dimensional (2D) materials |
| ASTM E 2735 : 2014 : REDLINE | Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
| ISO 27911:2011 | Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope |
| 16/30300288 DC : 0 | BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY |
| 13/30203230 DC : 0 | BS ISO 13095 - SURFACE CHEMICAL ANALYSIS - ATOMIC FORCE MICROSCOPY - PROCEDURE FOR IN SITU CHARACTERIZATION OF AFM PROBE SHANK PROFILE USED FOR NANOSTRUCTURE MEASUREMENT |
| BS ISO 13095:2014 | Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| BS ISO 11039:2012 | Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate |
| BS ISO 20579-4:2018 | Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
| ASTM E 2859 : 2011 : R2017 | Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
| ISO 20579-4:2018 | Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
| ISO 11952:2014 | Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems |
| ISO/TR 19693:2018 | Surface chemical analysis — Characterization of functional glass substrates for biosensing applications |
| PD ISO/TS 80004-13:2017 | Nanotechnologies. Vocabulary Graphene and related two-dimensional (2D) materials |
| PD CEN ISO/TS 80004-6:2015 | Nanotechnologies. Vocabulary Nano-object characterization |
| ISO 13095:2014 | Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| ASTM E 1829 : 2014 : REDLINE | Standard Guide for Handling Specimens Prior to Surface Analysis |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO/TS 80004-6:2013 | Nanotechnologies — Vocabulary — Part 6: Nano-object characterization |
| BS ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy |
| BS ISO 19668:2017 | Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials |
| ISO 11039:2012 | Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
| ISO 19668:2017 | Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials |
| BS ISO 27911:2011 | Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope |
| BS ISO 11775:2015 | Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants |
| BS ISO 13083:2015 | Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
| 10/30199182 DC : 0 | BS ISO 11039 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - MEASUREMENT OF DRIFT RATE |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| ISO 28600:2011 | Surface chemical analysis — Data transfer format for scanning-probe microscopy |
| ISO 20411:2018 | Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry |
| ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 13083:2015 | Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
| ASTM E 1078 : 2014 : REDLINE | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
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