ISO/TS 17915:2013
Withdrawn
View Superseded by
Optics and photonics — Measurement method of semiconductor lasers for sensing
Hardcopy , PDF
English
06-25-2013
04-12-2019
ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.
| Committee |
ISO/TC 172/SC 9
|
| DevelopmentNote |
DRAFT ISO/DIS 17915 is also available for this standard. (02/2017)
|
| DocumentType |
Technical Specification
|
| Pages |
27
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| PD ISO/TS 17915:2013 | Identical |
| IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
| IEC 60747-5-2:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics |
| ISO 13695:2004 | Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| ISO 11145:2016 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols |
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