ISO 13695:2004
Withdrawn
View Superseded by
Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
Hardcopy , PDF
English, French
06-07-2004
04-09-2025
ISO 13695:2004 specifies methods by which the spectral characteristics such as wavelength, bandwidth, spectral distribution and wavelength stability of a laser beam can be measured. ISO 13695:2004 is applicable to both continuous wave (cw) and pulsed laser beams. The dependence of the spectral characteristics of a laser on its operating conditions may also be important.
| Committee |
ISO/TC 172/SC 9
|
| DevelopmentNote |
Supersedes ISO/DIS 13695 (06/2004)
|
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy | |
| UnderRevision |
| Standards | Relationship |
| GOST R ISO 13695 : 2010 | Identical |
| NF EN ISO 13695 : 2005 | Identical |
| NBN EN ISO 13695 : 2004 | Identical |
| NEN EN ISO 13695 : 2004 | Identical |
| NS EN ISO 13695 : 1ED 2004 | Identical |
| I.S. EN ISO 13695:2004 | Identical |
| PN EN ISO 13695 : 2007 | Identical |
| BS EN ISO 13695:2004 | Identical |
| EN ISO 13695:2004 | Identical |
| DS/EN ISO 13695:2024 | Identical |
| DS EN ISO 13695 : 2004 | Identical |
| UNE-EN ISO 13695:2006 | Identical |
| DIN EN ISO 13695:2004-09 | Identical |
| 02/211632 DC : DRAFT DEC 2002 | IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS |
| ISO/TS 17915:2013 | Optics and photonics — Measurement method of semiconductor lasers for sensing |
| I.S. EN ISO 11252:2013 | LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION (ISO 11252:2013) |
| PD ISO/TS 17915:2013 | Optics and photonics. Measurement method of semiconductor lasers for sensing |
| IEC 60747-5-4:2006 | Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers |
| IEC 60601-2-75:2017 | Medical electrical equipment - Part 2-75: Particular requirements for the basic safety and essential performance of photodynamic therapy and photodynamic diagnosis equipment |
| ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation |
| BS EN ISO 11252:2013 | Lasers and laser-related equipment. Laser device. Minimum requirements for documentation |
| BS IEC 60747-5-4:2006 | Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers |
| DIN EN ISO 11252:2014-02 | LASERS AND LASER-RELATED EQUIPMENT - LASER DEVICE - MINIMUM REQUIREMENTS FOR DOCUMENTATION (ISO 11252:2013) |
| EN ISO 11252:2013 | Lasers and laser-related equipment - Laser device - Minimum requirements for documentation (ISO 11252:2013) |
| CEI EN IEC 60601-2-75:2020 | Medical Electrical Equipment Part 2: Particular requirements for the basic safety and essential performance of photodynamic therapy and photodynamic diagnosis equipment |
| UNE-EN ISO 11252:2013 | Lasers and laser-related equipment - Laser device - Minimum requirements for documentation (ISO 11252:2013) |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| ISO 12005:2003 | Lasers and laser-related equipment — Test methods for laser beam parameters — Polarization |
| ISO 11145:2016 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols |
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