JEDEC JEP148B:2014(R2019)
Superseded
View Superseded by
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
Hardcopy , PDF
English
09-01-2019
12-24-2025
The purpose of this procedure provides a consistent frame work for reliability qualification using the Physics-of-Failure (PoF) concept, which − is flexible with respect to the requirements of the intended application and market, − makes optimum use of the supplier’s advance quality planning and demonstration results gained during design and development and applicable knowledge based on design and technology similarities.
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| JEDEC JESD93A:2022 | MULTICHIP MODULES (MCM) |
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