JEDEC JEP148C:2025
Current
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
Hardcopy , PDF
English
11-01-2025
This publication provides a consistent framework for reliability qualification using the Physics-of-Failure (PoF) concept, which − is flexible with respect to the requirements of the intended application and market, and − makes optimum use of the supplier’s advanced quality planning and demonstration results gained during design and development and applicable knowledge based on design and technology similarities.
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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