JEDEC JESD 22-A117D:2018

Name: JEDEC JESD 22-A117D:2018 - ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
Brand: JEDEC Solid State Technology Association

Superseded

Add to Watchlist

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-22-2018

Publisher

JEDEC Solid State Technology Association

Superseded date

12-19-2022

Superseded by

JEDEC JESD 22-A117E:2018-11
JEDEC JESD22-A117E:2018(R2024)

Add to Watchlist

Free

Excluding Tax where applicable

This standard specifies the procedural requirements for performing valid endurance and retention tests based on a qualification specification.

Committee	JC-14.1
DocumentType	Standard
Pages	24
PublisherName	JEDEC Solid State Technology Association
Status	Superseded
SupersededBy	JEDEC JESD 22-A117E:2018-11 JEDEC JESD22-A117E:2018(R2024)
Supersedes	JEDEC JESD 22-A117C:2011

Summarise

ChatGPT Perplexity

Free

Excluding Tax where applicable

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Shopping Cart

JEDEC JESD 22-A117D:2018

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

Abstract

General Product Information

Industry

Sub-Industry